Workbench Reliability Prediction for PoL Converters using Standards and Temperature IR Detection

Abstract: (Sponsored by PELS TC 7) An in-depth presentation of the actual simplicity of the PoL converters reliability prediction methods, with hans-on components temperature detection examples, opens this topic to any audience. In the pursuit to improved reliability for modern electronic systems, particularly those employing point-of-load (PoL) dc-dc converters, thermal characterization plays a pivotal role. This webinar presents a comprehensive workbench methodology for determining the temperature profiles of critical converter components – such as output capacitors and switching transistors – under realistic operating conditions. By integrating infrared (IR) thermography with controlled electrical loading and ambient simulation, the approach enables precise thermal mapping which is essential for reliability assessment. The measured temperature data is then correlated with failure rate predictions using internationally recognized standards, such as MIL-HDBK-217F, Telcordia SR-332, IEC-TR-62380 or SN 29500. These standards provide a framework for estimating Mean Time Between Failures (MTBF) and identifying thermal stress thresholds that influence long-term performance. The study highlights the comparative sensitivity of different components to thermal degradation and demonstrates how infrared diagnostics can inform design improvements and predictive maintenance strategies. Ultimately, this workbench approach bridges the gap between empirical thermal analysis and standardized reliability modeling, offering a scalable and non-invasive technique for validating the robustness of PoL converters in mission-critical applications such as aerospace, automotive, and industrial.